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BS QC 750100:1986+A2:1996
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  • BS QC 750100:1986+A2:1996

BS QC 750100:1986+A2:1996

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Harmonized system of quality assessment for electronic components. Discrete semiconductor devices. Sectional specification

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Full Description

Procedures to be followed with discrete semiconductor devices (excluding optoelectronic devices), the possible group conditions for structurally similar devices, the requirements for quality conformance inspection and the various steps for screening. Also preferred values of voltages and currents, identification of terminals.

Cross References:
IEC 60747
IEC 60748
IEC 60749
IEC 47(Central Office)756
IEC 47(Central Office)810
IEC 47(Central Office)886
IEC 47(Central Office)887
IEC 47(Central Office)888
IEC 47(Central Office)891
IEC 47(Central Office)892
IEC 47(Central Office)955


Incorporates the following:
AMD 7208 published 15 October 1992
Amendment, January 2010. Amends and replaces BS QC 750000:1986 See more

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