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BS PD IEC TS 62607-12-3:2026
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Nanomanufacturing. Key control characteristics-2D material-related products. Schottky barrier heights of 2D material based field-effect transistors: temperature-dependent current-voltage measurements
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Nanomanufacturing. Key control characteristics-2D material-related products. Schottky barrier heights of 2D material based field-effect transistors: temperature-dependent current-voltage measurements