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BS PD IEC TS 62607-6-33:2025
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BS PD IEC TS 62607-6-33:2025

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Nanomanufacturing. Key control characteristics-Graphene-related products. Defect density of graphene: electron energy loss spectroscopy

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Full Description

This part of IEC TS 62607 establishes a standardized method to determine the key controlcharacteristic
– defect density (%, nm2)

of single layer graphene films by
– electron energy loss spectroscopy (EELS in transmission electron microscopy (TEM)).

This document outlines a method for quantitative measurement of defects in graphene at thenanoscale. See more

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