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BS PD IEC TS 62876-4-1:2025
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  • BS PD IEC TS 62876-4-1:2025

BS PD IEC TS 62876-4-1:2025

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Nanomanufacturing. Reliability assessment-Nanophotonic products. Optical stability test of quantum dot enabled light conversion films: Temperature, humidity and light exposure

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Full Description

This part of IEC 62876, which is a Technical Specification, establishes a general reliability testing programme to verify the reliability of the performance of quantum dots nanomaterials, and quantum dot enabled light conversion films (Q-LCFs).

The Q-LCF is used as subassemblies for the fabrication of nano-enabled photoelectrical display devices, mainly liquid crystal display (LCD) currently, with other components.

This testing programme defines standardized aging conditions, methodologies and data assessment for Q-LCF product.

The results of these tests define a stability under standardized aging conditions for quantitative evaluation of the reliability of the Q-LCF.

The procedures specified in this document were designed for Q-LCF but can be extended to serve as a guideline for other kinds of light conversion films or related subassemblies as well. See more

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